Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is utilized to capture high-resolution and greater depth micrographs of microstructural components ranging from several microns to a few nanometers in size. When equipped with Energy Dispersive Spectroscopy (EDS), SEM not only clearly depicts the morphology of particles but also quantifies the elements present in them. For instance, this technique is employed to examine fracture surfaces to identify the root cause of failures. The combination of SEM and EDS provides detailed insights into both the structural and compositional aspects of materials, making it an invaluable tool in materials analysis and failure investigation.

SEM is useful for investigating wear patterns and corrosion products on coatings and the adhesion properties of coatings by examining the interface between the coating and the substrate.